"Testing of Stuck-Open Faults in Nanometer Technologies."

Víctor H. Champac et al. (2012)

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DOI: 10.1109/MDT.2012.2205609

access: closed

type: Journal Article

metadata version: 2024-06-10

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Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barceló, Roberto Gómez, Chuck Hawkins, Jaume Segura:
Testing of Stuck-Open Faults in Nanometer Technologies. IEEE Des. Test Comput. 29(4): 80-91 (2012)

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