"Physical Techniques for Chip-Backside IC Debug in Nanotechnologies."

Christian Boit et al. (2008)

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DOI: 10.1109/MDT.2008.82

access: closed

type: Journal Article

metadata version: 2020-05-17

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Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist:
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Des. Test Comput. 25(3): 250-257 (2008)

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