"A BIST Approach to Approximate Co-Testing of Embedded Data Converters."

Kushagra Bhatheja et al. (2024)

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DOI: 10.1109/MDAT.2024.3365958

access: closed

type: Journal Article

metadata version: 2024-05-17

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Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen:
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41(3): 21-28 (2024)

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