"Low-Cost Testing of High-Density Logic Components."

Robert W. Bassett et al. (1990)

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DOI: 10.1109/54.53042

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/BassettBDFGPPW90
Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater:
Low-Cost Testing of High-Density Logic Components. IEEE Des. Test Comput. 7(2): 15-28 (1990)

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