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"Time-Frequency Analysis of a Variable Stiffness Model for Fault Development."
Leon Cohen et al. (2002)
- Leon Cohen, Lorenzo Galleani, Robert A. Hedges, David Hughes, Patrick J. Loughlin, Bruce W. Suter:
Time-Frequency Analysis of a Variable Stiffness Model for Fault Development. Digit. Signal Process. 12(2-3): 429-440 (2002)
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