"On degree-sequence characterization and the extremal number of edges for ..."

Shih-Yan Chen, Shin-Shin Kao, Hsun Su (2016)

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DOI: 10.46298/DMTCS.2149

access: open

type: Journal Article

metadata version: 2023-01-24

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Shih-Yan Chen, Shin-Shin Kao, Hsun Su:
On degree-sequence characterization and the extremal number of edges for various Hamiltonian properties under fault tolerance. Discret. Math. Theor. Comput. Sci. 17(3): 307-314 (2016)

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