"Bit-errors as a source of forensic information in NAND-flash memory."

Jan Peter van Zandwijk (2017)

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DOI: 10.1016/J.DIIN.2017.01.005

access: closed

type: Journal Article

metadata version: 2021-11-17

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Jan Peter van Zandwijk:
Bit-errors as a source of forensic information in NAND-flash memory. Digit. Investig. 20 Supplement: S12-S19 (2017)

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