"Fault Diagnosis of Analog Circuits Using Systematic Tests Based on Data ..."

Minfang Peng et al. (2013)

> Home

Details and statistics

DOI: 10.1007/S00034-012-9487-X

access: closed

type: Journal Article

metadata version: 2020-06-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cssp/PengTSX13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cssp/PengTSX13
Minfang Peng, Chi K. Tse, Meie Shen, Kai Xie:
Fault Diagnosis of Analog Circuits Using Systematic Tests Based on Data Fusion. Circuits Syst. Signal Process. 32(2): 525-539 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.