"Analog Circuit Specification Testing by Means of Walsh-Hadamard Transform ..."

Tomasz Golonek, Jan Machniewski (2018)

> Home

Details and statistics

DOI: 10.1007/S00034-017-0708-1

access: open

type: Journal Article

metadata version: 2020-06-21

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/cssp/GolonekM18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cssp/GolonekM18
Tomasz Golonek, Jan Machniewski:
Analog Circuit Specification Testing by Means of Walsh-Hadamard Transform and Multiple Regression Supported by Evolutionary Computations. Circuits Syst. Signal Process. 37(7): 2736-2771 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.