"Simulation-Based Inspection Policies for a One-Shot System in Storage Over ..."

Won Young Yun, Young-Jin Han, Ha-Won Kim (2014)

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DOI: 10.1080/03610918.2013.815772

access: closed

type: Journal Article

metadata version: 2020-05-10

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Won Young Yun, Young-Jin Han, Ha-Won Kim:
Simulation-Based Inspection Policies for a One-Shot System in Storage Over a Finite Time Span. Commun. Stat. Simul. Comput. 43(8): 1979-2003 (2014)

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