"Corrected rms error and effective number of bits for sine wave ADC tests."

Jerome J. Blair, Thomas E. Linnenbrink (2004)

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DOI: 10.1016/S0920-5489(03)00061-8

access: closed

type: Journal Article

metadata version: 2020-02-20

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Jerome J. Blair, Thomas E. Linnenbrink:
Corrected rms error and effective number of bits for sine wave ADC tests. Comput. Stand. Interfaces 26(1): 43-49 (2004)

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