"RHEED intensities from two-dimensional heteroepitaxial nanoscale systems ..."

Andrzej Daniluk (2019)

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DOI: 10.1016/J.CPC.2019.05.013

access: closed

type: Journal Article

metadata version: 2020-02-21

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Andrzej Daniluk:
RHEED intensities from two-dimensional heteroepitaxial nanoscale systems of GaN on AlN(0 0 0 1) and AlN(0 0 0 1¯) surfaces. Comput. Phys. Commun. 244: 487-489 (2019)

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