"An Affordable Experimental Technique for SRAM Write Margin ..."

Bartomeu Alorda et al. (2024)

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DOI: 10.48550/ARXIV.2411.15521

access: open

type: Informal or Other Publication

metadata version: 2025-01-01

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  - journals/corr/abs-2411-15521
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  - https://dblp.org/rec/journals/corr/abs-2411-15521
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota:
An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies. CoRR abs/2411.15521 (2024)

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