"Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation ..."

Yin-Yin Bao et al. (2024)

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DOI: 10.48550/ARXIV.2411.11029

access: open

type: Informal or Other Publication

metadata version: 2025-01-01

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  - journals/corr/abs-2411-11029
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  - https://dblp.org/rec/journals/corr/abs-2411-11029
Yin-Yin Bao, Er-Chao Li, Hong-Qiang Yang, Bin-Bin Jia:
Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network. CoRR abs/2411.11029 (2024)

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