"Deep Learning based Performance Testing for Analog Integrated Circuits."

Jiawei Cao et al. (2024)

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DOI: 10.48550/ARXIV.2406.00516

access: open

type: Informal or Other Publication

metadata version: 2024-07-04

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  - journals/corr/abs-2406-00516
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  - https://dblp.org/rec/journals/corr/abs-2406-00516
Jiawei Cao, Chongtao Guo, Hao Li, Zhigang Wang, Houjun Wang, Geoffrey Ye Li:
Deep Learning based Performance Testing for Analog Integrated Circuits. CoRR abs/2406.00516 (2024)

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