"StyleX: A Trainable Metric for X-ray Style Distances."

Dominik Eckert et al. (2024)

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DOI: 10.48550/ARXIV.2405.14718

access: open

type: Informal or Other Publication

metadata version: 2024-06-19

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  dblp key:
  - journals/corr/abs-2405-14718
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  - https://dblp.org/rec/journals/corr/abs-2405-14718
Dominik Eckert, Christopher Syben, Christian Hümmer, Ludwig Ritschl, Steffen Kappler, Sebastian Stober:
StyleX: A Trainable Metric for X-ray Style Distances. CoRR abs/2405.14718 (2024)

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