"Contrastive-Based Deep Embeddings for Label Noise-Resilient Histopathology ..."

Lucas Dedieu et al. (2024)

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DOI: 10.48550/ARXIV.2404.07605

access: open

type: Informal or Other Publication

metadata version: 2024-05-16

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  - journals/corr/abs-2404-07605
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Lucas Dedieu, Nicolas Nerrienet, Adrien Nivaggioli, Clara Simmat, Marceau Clavel, Arnaud Gauthier, Stéphane Sockeel, Rémy Peyret:
Contrastive-Based Deep Embeddings for Label Noise-Resilient Histopathology Image Classification. CoRR abs/2404.07605 (2024)

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