"Segment Anything in Defect Detection."

Bozhen Hu et al. (2023)

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DOI: 10.48550/ARXIV.2311.10245

access: open

type: Informal or Other Publication

metadata version: 2023-11-22

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  - journals/corr/abs-2311-10245
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  - https://dblp.org/rec/journals/corr/abs-2311-10245
Bozhen Hu, Bin Gao, Cheng Tan, Tongle Wu, Stan Z. Li:
Segment Anything in Defect Detection. CoRR abs/2311.10245 (2023)

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