"Delving into Crispness: Guided Label Refinement for Crisp Edge Detection."

Yunfan Ye et al. (2023)

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DOI: 10.48550/ARXIV.2306.15172

access: open

type: Informal or Other Publication

metadata version: 2023-06-30

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  - https://dblp.org/rec/journals/corr/abs-2306-15172
Yunfan Ye, Renjiao Yi, Zhirui Gao, Zhiping Cai, Kai Xu:
Delving into Crispness: Guided Label Refinement for Crisp Edge Detection. CoRR abs/2306.15172 (2023)

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