"Quantifying the effect of X-ray scattering for data generation in ..."

Vladyslav Andriiashen et al. (2023)

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DOI: 10.48550/ARXIV.2305.12822

access: open

type: Informal or Other Publication

metadata version: 2023-05-24

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  - journals/corr/abs-2305-12822
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  - https://dblp.org/rec/journals/corr/abs-2305-12822
Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen, Kees Joost Batenburg:
Quantifying the effect of X-ray scattering for data generation in real-time defect detection. CoRR abs/2305.12822 (2023)

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