"A Novel Patent Similarity Measurement Methodology: Semantic Distance and ..."

Yongmin Yoo et al. (2023)

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DOI: 10.48550/ARXIV.2303.16767

access: open

type: Informal or Other Publication

metadata version: 2023-04-14

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  - journals/corr/abs-2303-16767
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  - https://dblp.org/rec/journals/corr/abs-2303-16767
Yongmin Yoo, Cheonkam Jeong, Sanguk Gim, Junwon Lee, Zachary Schimke, Deaho Seo:
A Novel Patent Similarity Measurement Methodology: Semantic Distance and Technological Distance. CoRR abs/2303.16767 (2023)

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