"Development of a photothermal measurement model to determine layer ..."

Dimitri Rothermel, Thomas Schuster (2023)

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DOI: 10.48550/ARXIV.2301.10050

access: open

type: Informal or Other Publication

metadata version: 2023-01-26

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  - journals/corr/abs-2301-10050
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  - https://dblp.org/rec/journals/corr/abs-2301-10050
Dimitri Rothermel, Thomas Schuster:
Development of a photothermal measurement model to determine layer thickness of multi-layered coating systems with unknown thermal properties. CoRR abs/2301.10050 (2023)

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