"ODIM: an efficient method to detect outliers via inlier-memorization ..."

Dongha Kim et al. (2023)

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DOI: 10.48550/ARXIV.2301.04257

access: open

type: Informal or Other Publication

metadata version: 2023-01-19

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  - journals/corr/abs-2301-04257
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  - https://dblp.org/rec/journals/corr/abs-2301-04257
Dongha Kim, Jaesung Hwang, Jongjin Lee, Kunwoong Kim, Yongdai Kim:
ODIM: an efficient method to detect outliers via inlier-memorization effect of deep generative models. CoRR abs/2301.04257 (2023)

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