"SMART: Investigating the Impact of Threshold Voltage Suppression in an ..."

Saeed Seyedfaraji, Baset Mesgari, Semeen Rehman (2022)

> Home

Details and statistics

DOI: 10.48550/ARXIV.2209.04434

access: open

type: Informal or Other Publication

metadata version: 2022-09-27

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/corr/abs-2209-04434
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2209-04434
Saeed Seyedfaraji, Baset Mesgari, Semeen Rehman:
SMART: Investigating the Impact of Threshold Voltage Suppression in an In-SRAM Multiplication/Accumulation Accelerator for Accuracy Improvement in 65 nm CMOS Technology. CoRR abs/2209.04434 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.