"Multi defect detection and analysis of electron microscopy images with ..."

Mingren Shen et al. (2021)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2021-08-23

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2108-08883
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  - https://dblp.org/rec/journals/corr/abs-2108-08883
Mingren Shen, Guanzhao Li, Dongxia Wu, Yuhan Liu, Jacob Greaves, Wei Hao, Nathaniel J. Krakauer, Leah Krudy, Jacob Perez, Varun Sreenivasan, Bryan Sanchez, Oigimer Torres, Wei Li, Kevin Field, Dane Morgan:
Multi defect detection and analysis of electron microscopy images with deep learning. CoRR abs/2108.08883 (2021)

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