"Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis ..."

Nikolaos Dimitriou et al. (2020)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2020-03-03

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2002-10974
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  - https://dblp.org/rec/journals/corr/abs-2002-10974
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans. CoRR abs/2002.10974 (2020)

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