"Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM."

Kazybek Adam et al. (2018)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-10-05

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1809-10438
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1809-10438
Kazybek Adam, Kamilya Smagulova, Olga Krestinskaya, Alex Pappachen James:
Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM. CoRR abs/1809.10438 (2018)

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