"Pseudo-Ring Testing Schemes and Algorithms of RAM Built-In and Embedded ..."

Diana Bodean, Ghenadie Bodean, Wajeb Gharibi (2011)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1106-3677
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1106-3677
Diana Bodean, Ghenadie Bodean, Wajeb Gharibi:
Pseudo-Ring Testing Schemes and Algorithms of RAM Built-In and Embedded Self-Testing. CoRR abs/1106.3677 (2011)

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