"Blackbox identity testing for bounded top fanin depth-3 circuits: the ..."

Nitin Saxena, C. Seshadhri (2010)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-07-07

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1011-3234
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1011-3234
Nitin Saxena, C. Seshadhri:
Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter. CoRR abs/1011.3234 (2010)

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