"Specification Test Compaction for Analog Circuits and MEMS"

Sounil Biswas et al. (2007)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-0710-4719
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-0710-4719
Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi:
Specification Test Compaction for Analog Circuits and MEMS. CoRR abs/0710.4719 (2007)

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