"Research on insulator image segmentation and defect recognition technology ..."

Jiawen Chen et al. (2024)

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DOI: 10.1002/CPE.8266

access: closed

type: Journal Article

metadata version: 2024-11-30

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Jiawen Chen, Chao Cai, Fangbin Yan, Bowen Zhou:
Research on insulator image segmentation and defect recognition technology based on U-Net and YOLOv7. Concurr. Comput. Pract. Exp. 36(25) (2024)

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