"High-Level Test Generation for VLSI."

Debashis Bhattacharya, Brian T. Murray, John P. Hayes (1989)

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DOI: 10.1109/2.25379

access: closed

type: Journal Article

metadata version: 2020-08-12

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Debashis Bhattacharya, Brian T. Murray, John P. Hayes:
High-Level Test Generation for VLSI. Computer 22(4): 16-24 (1989)

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