"Black-Box Identity Testing of Depth-4 Multilinear Circuits."

Shubhangi Saraf, Ilya Volkovich (2018)

Details and statistics

DOI: 10.1007/S00493-016-3460-4

access: closed

type: Journal Article

metadata version: 2023-09-30

a service of  Schloss Dagstuhl - Leibniz Center for Informatics