"Method and application of data defect analysis based on linear ..."

Wendai Lv (2019)

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DOI: 10.1007/S10586-018-1861-4

access: closed

type: Journal Article

metadata version: 2020-09-29

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Wendai Lv:
Method and application of data defect analysis based on linear discriminant regression of far subspace. Clust. Comput. 22(Supplement): 4277-4282 (2019)

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