"Stacked convolutional sparse denoising auto-encoder for identification of ..."

Jianbo Yu, Xiaoyun Zheng, Jiatong Liu (2019)

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DOI: 10.1016/J.COMPIND.2019.04.015

access: closed

type: Journal Article

metadata version: 2023-09-30

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Jianbo Yu, Xiaoyun Zheng, Jiatong Liu:
Stacked convolutional sparse denoising auto-encoder for identification of defect patterns in semiconductor wafer map. Comput. Ind. 109: 121-133 (2019)

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