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"Full-IC manufacturability check based on dense silicon imaging."
Xiaolang Yan et al. (2005)
- Xiaolang Yan, Zheng Shi, Ye Chen, Yue Ma, Gensheng Gao:
Full-IC manufacturability check based on dense silicon imaging. Sci. China Ser. F Inf. Sci. 48(4): 533-544 (2005)

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