"Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM."

Cheng Xie et al. (2019)

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DOI: 10.1007/S11432-017-9549-8

access: closed

type: Journal Article

metadata version: 2025-01-19

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Cheng Xie, Yueyue Chen, Jianjun Chen, Jizuo Zhang:
Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM. Sci. China Inf. Sci. 62(6): 69402:1-69402:3 (2019)

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