"Single event upset induced by single event double transient and its ..."

Pengcheng Huang, Shuming Chen, Jianjun Chen (2016)

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DOI: 10.1007/S11432-015-5471-Y

access: closed

type: Journal Article

metadata version: 2020-03-02

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  - https://dblp.org/rec/journals/chinaf/HuangCC16
Pengcheng Huang, Shuming Chen, Jianjun Chen:
Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology. Sci. China Inf. Sci. 59(4): 042411:1-042411:8 (2016)

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