"Systematic calibration of drift diffusion model for InGaAs MOSFETs in ..."

Shaoyan Di et al. (2019)

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DOI: 10.1007/S11432-017-9472-X

access: closed

type: Journal Article

metadata version: 2020-03-02

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Shaoyan Di, Lei Shen, Pengying Chang, Kai Zhao, Tiao Lu, Gang Du, Xiaoyan Liu:
Systematic calibration of drift diffusion model for InGaAs MOSFETs in quasi-ballistic regime. Sci. China Inf. Sci. 62(6): 62406:1-62406:8 (2019)

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