"Nano-scaled transistor reliability characterization at nano-second regime."

Ran Cheng et al. (2021)

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DOI: 10.1007/S11432-020-3088-3

access: closed

type: Journal Article

metadata version: 2024-04-12

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Ran Cheng, Ying Sun, Yiming Qu, Wei Liu, Fanyu Liu, Jianfeng Gao, Nuo Xu, Bing Chen:
Nano-scaled transistor reliability characterization at nano-second regime. Sci. China Inf. Sci. 64(10) (2021)

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