"Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state ..."

Yilin Chen et al. (2023)

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DOI: 10.1007/S11432-021-3377-2

access: closed

type: Journal Article

metadata version: 2024-06-17

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Yilin Chen, Qing Zhu, Jiejie Zhu, Minhan Mi, Meng Zhang, Yuwei Zhou, Ziyue Zhao, Xiaohua Ma, Yue Hao:
Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light. Sci. China Inf. Sci. 66(2) (2023)

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