"YOLOv7-SiamFF: Industrial defect detection algorithm based on improved YOLOv7."

Feifan Yi et al. (2024)

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DOI: 10.1016/J.COMPELECENG.2024.109090

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type: Journal Article

metadata version: 2025-01-19

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Feifan Yi, Haigang Zhang, Jinfeng Yang, Liming He, Ahmad Sufril Azlan Mohamed, Shan Gao:
YOLOv7-SiamFF: Industrial defect detection algorithm based on improved YOLOv7. Comput. Electr. Eng. 114: 109090 (2024)

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