"Parametric investigation and trap sensitivity of n-p-n double gate ..."

Deepjyoti Deb et al. (2022)

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DOI: 10.1016/J.COMPELECENG.2022.107930

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type: Journal Article

metadata version: 2024-10-06

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Deepjyoti Deb, Rupam Goswami, Ratul Kr. Baruah, Kavindra Kandpal, Rajesh Saha:
Parametric investigation and trap sensitivity of n-p-n double gate TFETs. Comput. Electr. Eng. 100: 107930 (2022)

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