"Automatic quality inspection system for discrete manufacturing based on ..."

Bingsheng Chen, Huijie Chen, Mengshan Li (2021)

> Home

Details and statistics

DOI: 10.1016/J.COMPELECENG.2021.107435

access: closed

type: Journal Article

metadata version: 2021-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cee/ChenCL21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cee/ChenCL21
Bingsheng Chen, Huijie Chen, Mengshan Li:
Automatic quality inspection system for discrete manufacturing based on the Internet of Things. Comput. Electr. Eng. 95: 107435 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.