"Low-cost assessment of wheat resistance to yellow rust through ..."

Bangwei Zhou et al. (2015)

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DOI: 10.1016/J.COMPAG.2015.05.017

access: closed

type: Journal Article

metadata version: 2024-05-07

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Bangwei Zhou, Abdelhalim Elazab, Jordi Bort, O. Vergara, Maria Dolores Serret, José L. Araus:
Low-cost assessment of wheat resistance to yellow rust through conventional RGB images. Comput. Electron. Agric. 116: 20-29 (2015)

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