"A new spray deposition pattern measurement system based on spectral ..."

Yao Wen et al. (2019)

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DOI: 10.1016/J.COMPAG.2019.03.008

access: closed

type: Journal Article

metadata version: 2022-10-02

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Yao Wen, Ruirui Zhang, Liping Chen, Yanbo Huang, Tongchuan Yi, Gang Xu, Longlong Li, Andrew John Hewitt:
A new spray deposition pattern measurement system based on spectral analysis of a fluorescent tracer. Comput. Electron. Agric. 160: 14-22 (2019)

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