"Deep learning - Method overview and review of use for fruit detection and ..."

Anand Koirala et al. (2019)

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DOI: 10.1016/J.COMPAG.2019.04.017

access: closed

type: Journal Article

metadata version: 2020-10-26

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Anand Koirala, Kerry B. Walsh, Zhenglin Wang, Cheryl McCarthy:
Deep learning - Method overview and review of use for fruit detection and yield estimation. Comput. Electron. Agric. 162: 219-234 (2019)

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