"Identifying causes of crop yield variability with interpretive machine ..."

Edward J. Jones et al. (2022)

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DOI: 10.1016/J.COMPAG.2021.106632

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type: Journal Article

metadata version: 2022-12-07

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Edward J. Jones, Thomas F. A. Bishop, Brendan P. Malone, Patrick J. Hulme, Brett Whelan, Patrick Filippi:
Identifying causes of crop yield variability with interpretive machine learning. Comput. Electron. Agric. 192: 106632 (2022)

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