"Fault detection and identification using Bayesian recurrent neural networks."

Weike Sun et al. (2020)

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DOI: 10.1016/J.COMPCHEMENG.2020.106991

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type: Journal Article

metadata version: 2022-06-23

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Weike Sun, Antonio R. C. Paiva, Peng Xu, Anantha Sundaram, Richard D. Braatz:
Fault detection and identification using Bayesian recurrent neural networks. Comput. Chem. Eng. 141: 106991 (2020)

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