default search action
"Improvement of principal component analysis modeling for plasma etch ..."
Daegeun Ha et al. (2016)
- Daegeun Ha, Damdae Park, Junmo Koo, Kye Hyun Baek, Chonghun Han:
Improvement of principal component analysis modeling for plasma etch processes through discrete wavelet transform and automatic variable selection. Comput. Chem. Eng. 94: 362-369 (2016)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.